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research article

Investigation of electrical degradation effects in ferroelectric thin film based tunable microwave components

Astafiev, K.  
•
Sherman, V.
•
Tagantsev, A.  
Show more
2002
Integrated Ferroelectrics

The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.

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Type
research article
DOI
10.1080/10584580215500
Web of Science ID

WOS:000179830800013

Author(s)
Astafiev, K.  
Sherman, V.
Tagantsev, A.  
Setter, N.  
Rivkin, T.
Ginley, D.
Date Issued

2002

Published in
Integrated Ferroelectrics
Volume

49

Issue

1

Start page

103

End page

112

Subjects

ferroelectric films

•

nonlinearity

•

microwave

•

degradation effects

•

tunable devices

•

devices

•

planar

Note

Astafiev, K Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Natl Renewable Energy Lab, Golden, CO 80401 USA

625TC

Cited References Count:13

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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LC  
Available on Infoscience
August 21, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/233477
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