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research article

A quasi-analytical model for nanowire FETs with arbitrary polygonal cross section

De Michielis, L.  
•
Selmi, L.
•
Ionescu, A. M.  
2010
Solid-State Electronics

In this work a quasi-analytical physical model has been developed for the prediction of the potential in SiNW devices with arbitrary polygonal cross section. The model is then extended to the transport direction; a method for the calculation of the natural channel length has been proposed and validated by means of 2D and 3D numerical device simulations. With the results based on the proposed model it is possible to compare nanowires with cross sections of different shape and predict the minimum technological gate length able to assure immunity to the SCEs. (C) 2010 Elsevier Ltd. All rights reserved.

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Type
research article
DOI
10.1016/j.sse.2010.04.039
Web of Science ID

WOS:000280322300018

Author(s)
De Michielis, L.  
•
Selmi, L.
•
Ionescu, A. M.  
Date Issued

2010

Publisher

Elsevier

Published in
Solid-State Electronics
Volume

54

Issue

9

Start page

929

End page

934

Subjects

Silicon nanowire

•

Multi-gate MOSFET

•

Short-channel-effects

•

Fabrication

•

Silicon

•

Mosfets

Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
November 8, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/57236
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