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  4. Review: III-V infrared emitters on Si: fabrication concepts, device architectures and down-scaling with a focus on template-assisted selective epitaxy
 
review article

Review: III-V infrared emitters on Si: fabrication concepts, device architectures and down-scaling with a focus on template-assisted selective epitaxy

Tiwari, Preksha
•
Trivino, Noelia Vico
•
Schmid, Heinz
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May 1, 2023
Semiconductor Science And Technology

The local integration of III-Vs on Si is relevant for a wide range of applications in electronics and photonics, since it combines a mature and established materials platform with desired physical properties such as a direct and tuneable bandgap and high mobility. The large thermal expansion coefficient and lattice mismatch, however, pose a challenge for the direct growth of III-Vs on Si. In this paper we will review fabrication concepts to overcome this mismatch for the local integration of III-Vs on Si. In particular, we will briefly discuss processing methods based on aspect ratio trapping, nanowire growth, and template-assisted selective epitaxy (TASE). The focus of this review will be on the latter, where we will provide an overview of the different possibilities and embodiments of TASE and their promise for locally integrated active photonic devices.

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Type
review article
DOI
10.1088/1361-6641/ac9f60
Web of Science ID

WOS:000969032900001

Author(s)
Tiwari, Preksha
Trivino, Noelia Vico
Schmid, Heinz
Moselund, Kirsten E.  
Date Issued

2023-05-01

Publisher

IOP Publishing Ltd

Published in
Semiconductor Science And Technology
Volume

38

Issue

5

Article Number

053001

Subjects

Engineering, Electrical & Electronic

•

Materials Science, Multidisciplinary

•

Physics, Condensed Matter

•

Engineering

•

Materials Science

•

Physics

•

nanolasers

•

nanophotonics

•

iii-v epitaxy

•

monolithic integration

•

silicon-on-insulator

•

quantum-dot lasers

•

room-temperature operation

•

photonic-crystal

•

microdisk lasers

•

mu-m

•

single-nanowire

•

nanopillar lasers

•

threshold

•

performance

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

Available on Infoscience
May 8, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/197409
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