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  4. Luminescence and TEM-investigation of laser induced defects in (Al,Ga)As heterostructures
 
conference paper

Luminescence and TEM-investigation of laser induced defects in (Al,Ga)As heterostructures

Zysset, B.
•
Salathe, R. P.
•
Martin, J. L.
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1985
Microscopic Identification of Electronic Defects in Semiconductors

Laser induced defects in (Al,Ga)As heterostructures have been investigated. Luminescence topography reveals three different defects, a luminescent B, a nonradiative D as well as dark line defects (DLD). Luminescence and excitation spectra together with TEM measurements indicate a point defect or point defect complex for B and D. Defect B is described by a configuration coordinate (CC-) model with low vibrational energies. Defect DLD consists of extended dislocations

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Type
conference paper
DOI
10.1557/PROC-46-419
Author(s)
Zysset, B.
Salathe, R. P.
Martin, J. L.
Gotthardt, R.
Reinhart, F. K.
Date Issued

1985

Publisher

Mater. Res. Soc

Published in
Microscopic Identification of Electronic Defects in Semiconductors
Series title/Series vol.

MRS Proceedings; 46

Start page

419

Subjects

aluminium compounds

•

dislocations

•

gallium arsenide

•

III-V semiconductors

•

laser beam effects

•

luminescence of inorganic solids

•

point defects

•

semiconductor junctions

•

transmission electron microscope examination of materials

Note

Inst. of Appl. Phys., Bern Univ., Switzerland

2625868

semiconductor

luminescence

topography

TEM-investigation

laser induced defects

(Al,Ga)As heterostructures

dark line defects

excitation spectra

point defect

point defect complex

extended dislocations

Written at

OTHER

EPFL units
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Event place
Available on Infoscience
January 20, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/33971
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