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  4. Room temperature polariton lasing in III-nitride microcavities, a comparison with blue GaN-based vertical cavity surface emitting lasers
 
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conference paper

Room temperature polariton lasing in III-nitride microcavities, a comparison with blue GaN-based vertical cavity surface emitting lasers

Butte, Raphael
•
Christmann, Gabriel
•
Feltin, Eric
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2009
Gallium Nitride Materials And Devices Iv
Conference on Gallium Nitride Materials and Devices IV

The authors report on room temperature (RT) lasing action in two different types of nitride-based microcavities (MCs): vertical cavity surface emitting lasers (VCSELs) and polariton lasers which operate in the weak and in the strong coupling regime, respectively. Following a brief description of these two operating regimes, an analysis of lasing action at RT is reported for a crack-free planar VCSEL structure based on a bottom lattice-matched AlInN/GaN distributed Bragg reflector (DBR) and a top dielectric DBR. The cavity region, formed by n- and p-type GaN layers surrounding only three InGaN/GaN quantum wells, corresponds to a typical active region suitable for an electrically driven VCSEL. Processing issues of such planar VCSEL structures and electroluminescence characteristics of processed devices are also reported. Then, an alternative approach relying on the realization of coherent GaN-MC light sources based on the spontaneous decay of a macroscopic polariton population, the so-called polariton laser, is described. It is shown that this kind of devices could work at RT with a potentially much lower threshold current density than VCSELs as it does not necessitate reaching population inversion conditions. As for VCSELs, we demonstrate laser-like properties above threshold, i.e. an intense polarized emission and a strong spectral narrowing. Differences of polariton lasers with conventional lasers are also highlighted.

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Type
conference paper
DOI
10.1117/12.803718
Web of Science ID

WOS:000285752800023

Author(s)
Butte, Raphael
•
Christmann, Gabriel
•
Feltin, Eric
•
Castiglia, Antonino
•
Levrat, Jacques
•
Cosendey, Gatien
•
Altoukhov, Alexei
•
Carlin, Jean-Francois
•
Grandjean, Nicolas
Date Issued

2009

Publisher

Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa

Published in
Gallium Nitride Materials And Devices Iv
ISBN of the book

978-0-8194-7462-9

Series title/Series vol.

Proceedings of SPIE-The International Society for Optical Engineering; 7216

Start page

721619

Subjects

III-nitride

•

GaN

•

microcavity

•

room temperature

•

Vcsel

•

laser

•

strong coupling regime

•

polariton

•

Distributed Bragg Reflectors

•

Bose-Einstein Condensation

•

Emission Coupling Factor

•

Continuous-Wave

Written at

EPFL

EPFL units
SB  
Event nameEvent placeEvent date
Conference on Gallium Nitride Materials and Devices IV

San Jose, CA

Jan 26-29, 2009

Available on Infoscience
December 16, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/74588
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