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  4. Surface roughness parameters measurements by Digital Holographic Microscopy (DHM)
 
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conference paper

Surface roughness parameters measurements by Digital Holographic Microscopy (DHM)

Montfort, Frédéric  
•
Emery, Yves
•
Solanas, E.
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2006
Proceedings of the International Symposium on Precision Mechanical Measurements
International Symposium on Precision Mechanical Measurements
  • Details
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Type
conference paper
DOI
10.1117/12.716113
Author(s)
Montfort, Frédéric  
•
Emery, Yves
•
Solanas, E.
•
Cuche, Etienne  
•
Aspert, Nicolas
•
Marquet, Pierre
•
Joris, Claude
•
Kühn, Jonas
•
Depeursinge, Christian  
Date Issued

2006

Published in
Proceedings of the International Symposium on Precision Mechanical Measurements
Subjects

[MVD]

Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
International Symposium on Precision Mechanical Measurements

Urumqi

August 2-6, 2006

Available on Infoscience
August 3, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41965
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