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research article

Spectroscopic ellipsometry of RuO2 films prepared by metalorganic chemical vapor deposition

Hones, Peter
•
Gerfin, Tobias
•
Graetzel, Michael  
1995
Applied Physics Letters
  • Details
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Type
research article
DOI
10.1063/1.114870
Web of Science ID

WOS:A1995TF57400009

Author(s)
Hones, Peter
•
Gerfin, Tobias
•
Graetzel, Michael  
Date Issued

1995

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

67

Issue

21

Start page

3078

End page

80

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPI  
Available on Infoscience
February 21, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/224825
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