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conference paper
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
January 1, 2020
31St International Conference On Photonic, Electronic And Atomic Collisions (Icpeac Xxxi)
We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
Type
conference paper
Web of Science ID
WOS:000567819501110
Authors
Niozu, A.
•
Kumagai, Y.
•
Nishiyama, T.
•
Fukuzawa, H.
•
Motomura, K.
•
•
Ito, Y.
•
Takanashi, T.
•
Asa, K.
•
Sato, Y.
Publication date
2020-01-01
Publisher
Publisher place
Bristol
Published in
31St International Conference On Photonic, Electronic And Atomic Collisions (Icpeac Xxxi)
Series title/Series vol.
Journal of Physics Conference Series
Volume
1412
Start page
202028
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Event name | Event place | Event date |
Deauville, FRANCE | Jul 23-30, 2019 | |
Available on Infoscience
June 19, 2021
Use this identifier to reference this record