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  4. Double Edge Triggered Feedback Flip-Flop based on Independent Gate FinFETs in 32nm Technology
 
conference paper not in proceedings

Double Edge Triggered Feedback Flip-Flop based on Independent Gate FinFETs in 32nm Technology

Jazaeri, F.
•
AfzaliKusha, A.
2009
the 4th IEEE SPIE European International Symposium on Microtechnologies
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Type
conference paper not in proceedings
Author(s)
Jazaeri, F.
AfzaliKusha, A.
Date Issued

2009

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
STI  
Event nameEvent placeEvent date
the 4th IEEE SPIE European International Symposium on Microtechnologies

Germany

May 2009

Available on Infoscience
October 19, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/96278
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