Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Error Handling in Multimodal Biometric Systems using Reliability Measures
 
conference paper

Error Handling in Multimodal Biometric Systems using Reliability Measures

Kryszczuk, K.
•
Richiardi, J.
•
Prodanov, P.  
Show more
2005
2005 13th European Signal Processing Conference
2005 13th European Signal Processing Conference

In this paper, we present a framework for predicting and correcting classification decision errors based on modality reliability measures in a multimodal biometric system. In our experiments we use face and speech experts based on a recently proposed framework which uses Bayesian networks. The expert decisions and the accompanying information on their reliability are combined in a decision module that produces the final verification decision. The proposed system is consequently shown to yield higher decision accuracy than the corresponding unimodal systems.

  • Details
  • Metrics
Type
conference paper
Author(s)
Kryszczuk, K.
Richiardi, J.
Prodanov, P.  
Drygajlo, A.
Date Issued

2005

Publisher

IEEE

Published in
2005 13th European Signal Processing Conference
ISBN of the book

978-160-4238-21-1

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSA  
Event nameEvent placeEvent date
2005 13th European Signal Processing Conference

Antalya, Turkey

4-8 Sept. 2005

Available on Infoscience
December 7, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/237733
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés