The analysis of oriented features in images requires two-dimensional directional wavelets. Among these, we study in detail the class of Cauchy wavelets, which are strictly supported in a (narrow) convex cone in spatial frequency space. They have excellent angular selectivity, as shown by a standard calibration test, and they have minimal uncertainty. In addition, we present a new application of directional wavelets, namely a technique for determining the symmetries of a given pattern with respect to rotations and dilation.