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  4. A TEM study of the structure in PtSi ultrathin layers obtained on Si(100) by Pt sputtering and annealing
 
research article

A TEM study of the structure in PtSi ultrathin layers obtained on Si(100) by Pt sputtering and annealing

Ruterana, P
•
Solt, K
•
Buffat, PA  
1991
Surface Science
  • Details
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Type
research article
DOI
10.1016/0039-6028(91)90971-T
Web of Science ID

WOS:A1991FY12600030

Author(s)
Ruterana, P
Solt, K
Buffat, PA  
Date Issued

1991

Published in
Surface Science
Volume

251-252

Start page

150

End page

154

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2738
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