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  4. Inhomogeneous strain relaxation and detect distribution of ZnTe layers deposited on (110)GaAs by metalorganic vapor phase epitaxy (vol 78, pg 229, 1995)
 
research article

Inhomogeneous strain relaxation and detect distribution of ZnTe layers deposited on (110)GaAs by metalorganic vapor phase epitaxy (vol 78, pg 229, 1995)

Lovergine, N.
•
Liaci, F.
•
Ganiere, J. D.  
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1996
Journal of Applied Physics
  • Details
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Type
research article
DOI
10.1063/1.362719
Web of Science ID

WOS:A1996TN21100087

Author(s)
Lovergine, N.
Liaci, F.
Ganiere, J. D.  
Leo, G.
Drigo, A. V.
Romanto, F.
Mancini, A. M.
Vasanelli, L.
Date Issued

1996

Published in
Journal of Applied Physics
Volume

79

Issue

1

Start page

562

End page

562

Note

Infm lecce,unita gnsm,i-73100 lecce,italy. ecole polytech fed lausanne,inst micro & optoelectr,ch-1015 lausanne,switzerland. cnr,ime,inst mat elettron,i-73100 lecce,italy. univ padua,dipartimento fis g galilei,i-35100 padua,italy. infm padova,unita gnsm,i-35100 padua,italy. Lovergine, N, UNIV LECCE,DIPARTIMENTO SCI MAT,VIA ARNESANO,I-73100 LECCE,ITALY.

ISI Document Delivery No.: TN211

Cited Reference Count: 1

Cited References:

LOVERGINE N, 1995, J APPL PHYS, V78, P229

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOEQ  
Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11209
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