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review article

Gas-assisted focused electron beam and ion beam processing and fabrication

Utke, Ivo
•
Hoffmann, Patrik
•
Melngailis, John
2008
Journal Of Vacuum Science & Technology B

Beams of electrons and ions are now fairly routinely focused to dimensions in the nanometer range. Since the beams can be used to locally alter material at the point where they are incident on a surface, they represent direct nanofabrication tools. The authors will focus here on direct fabrication rather than lithography, which is indirect in that it uses the intermediary of resist. In the case of both ions and electrons, material addition or removal can be achieved using precursor gases. In addition ions can also alter material by sputtering (milling), by damage, or by implantation. Many material removal and deposition processes employing precursor gases have been developed for numerous practical applications, such as mask repair, circuit restructuring and repair, and sample sectioning. The authors will also discuss structures that are made for research purposes or for demonstration of the processing capabilities. In many cases the minimum dimensions at which these processes can be realized are considerably larger than the beam diameters. The atomic level mechanisms responsible for the precursor gas activation have not been studied in detail in many cases. The authors will review the state of the art and level of understanding of direct ion and electron beam fabrication and point out some of the unsolved problems. (c) 2008 American Vacuum Society.

  • Details
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Type
review article
DOI
10.1116/1.2955728
Web of Science ID

WOS:000258494400003

Author(s)
Utke, Ivo
Hoffmann, Patrik
Melngailis, John
Date Issued

2008

Published in
Journal Of Vacuum Science & Technology B
Volume

26

Start page

1197

End page

1276

Subjects

Chemical-Vapor-Deposition

•

Scanning-Tunneling-Microscopy

•

Field-Emitter Array

•

Direct-Write Nanolithography

•

Induced Surface-Reaction

•

Low-Energy Electrons

•

Accurate Semiempirical Equation

•

Atomic-Force Microscopy

•

Mask Repair

•

Carbon-Monoxide

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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Available on Infoscience
November 30, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/61104
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