Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Degradation defects in electron-beam-pumped Zn1-xCdxSe/ZnSe graded-index separate-confinement heterostructure (GRINSCH) blue and blue-green lasers
 
research article

Degradation defects in electron-beam-pumped Zn1-xCdxSe/ZnSe graded-index separate-confinement heterostructure (GRINSCH) blue and blue-green lasers

Bonard, J. M.
•
Ganiere, J. D.  
•
Vanzetti, L.
Show more
1997
Philosophical Magazine Letters

Degradation defects induced by electron-beam bombardment in Zn1-xCdxSe/ZnSe (001) graded-index separate-confinement blue-green laser structures have been characterized by transmission electron microscopy. Most defects appear as tree-like arrangements of small extrinsic and intrinsic dislocation loops opening in +/-[100] or +/-[010] directions and are located within the quantum well or at its boundaries. The Burgers vectors of the loops were identified as b = 1/2[01(1) over bar] and b = 1/2[10(1) over bar] for defects opening in the +/-[100] and +/-[010] directions respectively.

  • Details
  • Metrics
Type
research article
DOI
10.1080/095008397179147
Web of Science ID

WOS:A1997XU82100009

Author(s)
Bonard, J. M.
Ganiere, J. D.  
Vanzetti, L.
Paggel, J. J.
Sorba, L.
Franciosi, A.
Herve, D.
Molva, E.
Date Issued

1997

Published in
Philosophical Magazine Letters
Volume

76

Issue

3

Start page

181

End page

187

Subjects

GAALAS-GAAS LASERS

•

DARK LINE DEFECTS

•

LIGHT EMITTERS

•

MICROSCOPY

•

DIODE

Note

Cnr,ist icmat,i-00016 rome,italy. univ trieste,dipartimento fis,i-34127 trieste,italy. ecole polytech fed lausanne,inst phys expt,dept phys,inst micro & optoelect,ch-1015 lausanne,switzerland. ist nazl fis mat,lab nazl tasc,i-34012 trieste,italy. dept optron,lab elect technol & instrumentat,commissariat energie atom technol avancees,f-38054 grenoble 9,france.

ISI Document Delivery No.: XU821

Cited Reference Count: 16

Cited References:

BONARD JM, 1997, IN PRESS

EDINGTON JW, 1975, PRACTICAL ELECT MICR, V3

GUHA S, 1993, APPL PHYS LETT, V63, P3107

HERVE D, 1995, APPL PHYS LETT, V67, P2144

HOVINEN M, 1995, APPL PHYS LETT, V66, P2013

HUA GC, 1994, APPL PHYS LETT, V65, P1331

HUTCHINSON PW, 1975, APPL PHYS LETT, V26, P250

NAKANO K, 1996, J ELECTRON MATER, V25, P213

OHARA S, 1977, APPL PHYS LETT, V30, P368

PETROFF P, 1974, J APPL PHYS, V45, P3899

RUHLE M, 1967, PHYS STATUS SOLIDI, V19, P263

SALAMANCARIBA L, 1996, J ELECTRON MATER, V25, P239

TANIGUCHI S, 1996, ELECTRON LETT, V32, P552

UREN GD, 1995, APPL PHYS LETT, V67, P3862

WILKENS M, 1972, PHYS STATUS SOLIDI B, V49, P749

WILKENS M, 1978, DIFFRACTION IMAGING

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOEQ  
Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11241
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés