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2011
2011 18th IEEE International Conference on Electronics, Circuits, and Systems
CAD tools for fast analysis of parasitic coupling and mismatch effects in switched-capacitor circuits
conference paper
This paper presents a switched-capacitor simulator, optimized for fast computations. Two CAD tools are implemented in order to perform Monte-Carlo simulations, to identify sensitive parasitic coupling prior to layout and to rapidly verify parasitic coupling from an existing layout. Simulation results and measurements on a ΣΔ ADC are compared to validate the tools. © 2011 IEEE.
Type
conference paper
Author(s)
Date Issued
2011
Publisher
Journal
2011 18th IEEE International Conference on Electronics, Circuits, and Systems
Start page
354
End page
357
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Beirut, Lebanon | 11-14 December 2011 | |
Available on Infoscience
July 5, 2012
Use this identifier to reference this record