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  4. Piezoresistive cantilevers in a commercial CMOS technology for intermolecular force detection
 
conference paper

Piezoresistive cantilevers in a commercial CMOS technology for intermolecular force detection

Villanueva, G.  
•
Perez-Murano, F.
•
Zimmermann, M.
Show more
2006
Microelectronic Engineering
31st International Conference on Micro- and Nano- Engineering (MNE)

We report the development of piezoresistive cantilevers for intermolecular force detection in biochemical sensing, by using a commercial CMOS technology. The detection of the small forces involved in molecular recognition requires cantilevers with a small spring constant and high force sensitivity. We have fabricated polycrystalline silicon cantilevers by using the two polysilicon layers of a commercial CMOS process with minimum design rule widths. The cantilevers have been released by post-process micromachining. The upper polysilicon layer has been used as a piezoresistor. CMOS amplifying circuits have been integrated on-chip with the cantilever structures. The cantilevers have small spring constants ranging from 1.5 to 12 mN/m. The complete system has been successfully tested by applying a known transverse displacement with an AFM tip. A force sensitivity of 8 mu V/pN and resolution of 50 pN has been obtained. This high resolution is obtained with CMOS polysilicon, which has a relatively low piezoresistive coefficient, but this is compensated by the integration of signal-processing circuitry. (c) 2006 Elsevier B.V. All rights reserved.

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Type
conference paper
DOI
10.1016/j.mee.2006.01.223
Web of Science ID

WOS:000237581900163

Author(s)
Villanueva, G.  
•
Perez-Murano, F.
•
Zimmermann, M.
•
Lichtenberg, J.
•
Bausells, J.
Date Issued

2006

Published in
Microelectronic Engineering
Volume

83

Issue

4-9

Start page

1302

End page

1305

Subjects

piezoresistive cantilever

•

cmos cantilever

•

force detection

•

microscopy

•

recognition

Note

Bausells, J CSIC, IMB, Ctr Nacl Microelect, Campus UAB, Barcelona 08193, Spain CSIC, IMB, Ctr Nacl Microelect, Barcelona 08193, Spain ETH, Phys Elect Lab, CH-8093 Zurich, Switzerland, 043EG, Times Cited:0, Cited References Count:17

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
NEMS  
Event nameEvent placeEvent date
31st International Conference on Micro- and Nano- Engineering (MNE)

Vienna, Austria

2005

Available on Infoscience
August 6, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/93862
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