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conference output
Measurement of Electrostatic Potentials in Semiconductor Devices by Off-axis Electron Holography
July 24, 2024
Type
conference output
Scopus ID
2-s2.0-85215673236
Author(s)
Editors
Celio, G.
•
LeBeau, J.
•
Evans, J.
•
Spurgeon, S.
•
Guy, N.
Date Issued
2024-07-24
Published in
Special issue title
Supplement_1
Volume
30
Start page
154
End page
156
Written at
EPFL
EPFL units
| Event name | Event acronym | Event place | Event date |
Cleveland, United States | 2024-07-28 - 2024-08-01 | ||
Available on Infoscience
February 11, 2025
Use this identifier to reference this record