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2003
ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis
High Resolution Backside Thermography using a Numerical Aperture Increasing Lens
conference paper
Type
conference paper
Author(s)
Date Issued
2003
Journal
ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis
Start page
14
End page
17
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Santa Clara, CA | 2-6 November 2003 | |
Available on Infoscience
August 30, 2005
Use this identifier to reference this record