conference paper not in proceedings

1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm

Martens, Koen
•
Du Bois, Bert
•
Kong Siew, Yong
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Enz, Christian  
2019
25th International Conference on Noise and Fluctuations (ICNF 2019)