conference paper not in proceedings
1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm
2019
Type
conference paper not in proceedings
Author(s)
Martens, Koen
Du Bois, Bert
Kong Siew, Yong
Gupta, Anshul
Veloso, Anabela
Dupuy, Emmanuel
Radisic, Dunja
Altamirano Sanchez, Efrain
Van Roy, Willem
Severi, Simone
Editors
Date Issued
2019
Publisher
Editorial or Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
| Event name | Event place | Event date |
EPFL Neuchâtel campus - Neuchâtel, Switzerland | 18 - 21 June 2019 | |
Available on Infoscience
August 21, 2019
Use this identifier to reference this record