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conference paper

Determination of minimum conductivity of graphene from contactless microwaves measurements

Sharma, Pankaj  
•
Gomez-Diaz, Juan Sebastian
•
Ionescu, Mihai Adrian  
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2012
2012 12Th Ieee Conference On Nanotechnology (Ieee-Nano)
IEEE NANO 2012 - 12th International Conference on Nanotechnology

We report a non-direct method to determine the minimum conductivity (sigma(min)) of graphene. The proposed technique is based on the prior characterization of graphene sheet impedance at microwave frequencies using waveguides, and on the subsequent extraction of sigma(min) from the measured scattering rate. This approach presents some advantages as compared with standard DC characterization methods, as it is inherently contactless and does not require graphene patterning. Our experimental study estimates a sigma(min) in the range of 2e(2)/h-4e(2)/h for different samples. We also compute the density of charged impurities of our samples, and show that they are related to graphene conductivity at its Dirac point.

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Type
conference paper
DOI
10.1109/NANO.2012.6322060
Web of Science ID

WOS:000309933900175

Author(s)
Sharma, Pankaj  
•
Gomez-Diaz, Juan Sebastian
•
Ionescu, Mihai Adrian  
•
Perruisseau-Carrier, Julien  
Date Issued

2012

Publisher

Ieee

Publisher place

New York

Published in
2012 12Th Ieee Conference On Nanotechnology (Ieee-Nano)
ISBN of the book

978-1-4673-2200-3

Total of pages

4

Subjects

Graphene

•

Minimum Conductivity

•

Relaxation time

•

microwave

•

millimeter wave

Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LEMA  
MNWAVE  
NANOLAB  
Event nameEvent placeEvent date
IEEE NANO 2012 - 12th International Conference on Nanotechnology

Birmingham, UK

August, 20-23, 2012

Available on Infoscience
May 2, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/79952
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