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research article

Quantitative characterization of surface topography using spectral analysis

Jacobs, Tevis D B
•
Junge, Till  
•
Pastewka, Lars
2016
Surface Topology: Metrology and Properties

Roughness determines many functional properties of surfaces, such as adhesion, friction, and (thermal and electrical) contact conductance. Recent analytical models and simulations enable quantitative prediction of these properties from knowledge of the power spectral density (PSD) of the surface topography. The utility of the PSD is that it contains statistical information that is unbiased by the particular scan size and pixel resolution chosen by the researcher. In this article, we first review the mathematical definition of the PSD, including the one- and two-dimensional cases, and common variations of each. We then discuss strategies for reconstructing an accurate PSD of a surface using topography measurements at different size scales. Finally, we discuss detecting and mitigating artifacts at the smallest scales, and computing upper/lower bounds on functional properties obtained from models. We accompany our discussion with virtual measurements on computer-generated surfaces. This discussion summarizes how to analyze topography measurements to reconstruct a reliable PSD. Analytical models demonstrate the potential for tuning functional properties by rationally tailoring surface topography—however, this potential can only be achieved through the accurate, quantitative reconstruction of the PSDs of real-world surfaces.

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Type
research article
DOI
10.1088/2051-672X/aa51f8
Author(s)
Jacobs, Tevis D B
Junge, Till  
Pastewka, Lars
Date Issued

2016

Published in
Surface Topology: Metrology and Properties
Volume

5

Issue

1

Article Number

013001

Subjects

surface topography

•

power spectral density

•

contact mechanics

•

scanning probe techniques

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
IGM  
Available on Infoscience
October 3, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/140972
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