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  4. Growth and Characterization of Gaalas Gaas and Gainas Inp Structures - the Effect of a Pulse Metalorganic Flow
 
research article

Growth and Characterization of Gaalas Gaas and Gainas Inp Structures - the Effect of a Pulse Metalorganic Flow

Sacilotti, M.
•
Horiuchi, L.
•
Decobert, J.
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1992
Journal of Applied Physics

GaAlAs/GaAs and GaInAs/InP thick layers, single and multiple quantum wells were grown by atmospheric pressure metalorganic vapor phase epitaxy. Auger electron spectroscopy, wedge transmission electron microscopy, x-ray diffraction, low-temperature photoluminescence, and scanning electron microscopy were used to analyze the crystal quality. These analysis techniques show that layers grown using high vapor pressure metalorganic sources present fluctuations in the ternary alloy composition. We propose that these fluctuations are due to the pulse character of the high vapor pressure metalorganic flow. Bubbling experiments were performed to show the relationship between ternary layer composition fluctuation and the pulse character of the metalorganic flow. High vapor pressure metalorganic source like trimethylgallium presents tens of Angstroms growth rate per pulse or bubble whereas a low vapor pressure source like triethylgallium presents few Angstroms growth rate per bubble.

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Type
research article
DOI
10.1063/1.350734
Web of Science ID

WOS:A1992GX65500030

Author(s)
Sacilotti, M.
Horiuchi, L.
Decobert, J.
Brasil, M. J.
Cardoso, L. P.
Ossart, P.
Ganiere, J. D.  
Date Issued

1992

Published in
Journal of Applied Physics
Volume

71

Issue

1

Start page

179

End page

186

Subjects

MOLECULAR-BEAM EPITAXY

•

CHEMICAL VAPOR-DEPOSITION

•

QUANTUM-WELL

•

STRUCTURES

•

ELECTRON-MICROSCOPY

•

MOVPE GROWTH

•

HETEROSTRUCTURES

•

PRESSURE

•

PHOTOLUMINESCENCE

•

SUPERLATTICES

•

QUALITY

Note

Unicamp,inst fis,br-13081 campinas,sp,brazil. ecole polytech fed lausanne,dept phys,ch-1015 lausanne,switzerland. ctr natl etud telecommun,f-92220 bagneux,france. Sacilotti, m, cpqd telebras,caixa postal 1579,br-13083 campinas,sp,brazil.

ISI Document Delivery No.: GX655

Cited Reference Count: 40

Cited References:

1986, ALFA VENTRON CATALOG

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WELCH DF, 1985, APPL PHYS LETT, V46, P991

Editorial or Peer reviewed

REVIEWED

Written at

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Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11061
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