Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Exciton Localization On Basal Stacking Faults In A-Plane GaN Probed By Picosecond Time-Resolved Cathodoluminescence
 
conference paper

Exciton Localization On Basal Stacking Faults In A-Plane GaN Probed By Picosecond Time-Resolved Cathodoluminescence

Corfdir, P.  
•
Lefebvre, P.
•
Ristic, J.
Show more
2010
11Th International Conference On Optics Of Excitons In Confined Systems (Oecs11)
11th International Conference on Optics of Excitons in Confined Systems
  • Details
  • Metrics
Type
conference paper
Web of Science ID

WOS:000289715800175

Author(s)
Corfdir, P.  
Lefebvre, P.
Ristic, J.
Dussaigne, A.  
Sonderegger, S.
Martin, D.  
Ganiere, J.-D.  
Grandjean, N.  
Deveaud-Pledran, B.  
Date Issued

2010

Publisher

Iop Publishing Ltd, Dirac House, Temple Back, Bristol Bs1 6Be, England

Published in
11Th International Conference On Optics Of Excitons In Confined Systems (Oecs11)
Series title/Series vol.

Journal of Physics Conference Series; 210

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LASPE  
LOEQ  
Event nameEvent date
11th International Conference on Optics of Excitons in Confined Systems

Sep 07-11, 2009

Available on Infoscience
December 16, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/74704
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés