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  4. A Machine-Learning Architecture for Sensor Fault Detection, Isolation, and Accommodation in Digital Twins
 
research article

A Machine-Learning Architecture for Sensor Fault Detection, Isolation, and Accommodation in Digital Twins

Darvishi, Hossein  
•
Ciuonzo, Domenico
•
Rossi, Pierluigi Salvo
February 1, 2023
Ieee Sensors Journal

Sensor technologies empower Industry 4.0 by enabling integration of in-field and real-time raw data into digital twins (DTs). However, sensors might be unreliable due to inherent issues and/or environmental conditions. This article aims at detecting anomalies instantaneously in measurements from sensors, identifying the faulty ones and accommodating them with appropriate estimated data, thus paving the way to reliable DTs. More specifically, a real-time general machine-learning-based architecture for sensor validation is proposed, built upon a series of neural-network estimators and a classifier. Estimators correspond to virtual sensors of all unreliable sensors (to reconstruct normal behavior and replace the isolated faulty sensor within the system), whereas the classifier is used for detection and isolation tasks. A comprehensive statistical analysis on three different real-world datasets is conducted and the performance of the proposed architecture is validated under hard and soft synthetically generated faults.

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Type
research article
DOI
10.1109/JSEN.2022.3227713
Web of Science ID

WOS:000966000000001

Author(s)
Darvishi, Hossein  
Ciuonzo, Domenico
Rossi, Pierluigi Salvo
Date Issued

2023-02-01

Published in
Ieee Sensors Journal
Volume

23

Issue

3

Start page

2522

End page

2538

Subjects

Engineering, Electrical & Electronic

•

Instruments & Instrumentation

•

Physics, Applied

•

Engineering

•

Instruments & Instrumentation

•

Physics

•

sensors

•

sensor systems

•

fault diagnosis

•

artificial neural networks

•

task analysis

•

fault detection

•

proposals

•

digital twin (dt)

•

fault diagnosis

•

machine learning

•

neural networks (nns)

•

sensor validation

•

networks

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

Available on Infoscience
May 8, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/197441
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