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research article

Cross-Sectional Atomic Force Imaging of Semiconductor Heterostructures

Dwir, B.  
•
Reinhardt, F.
•
Biasiol, G.
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1996
Materials Science and Engineering B
  • Details
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Type
research article
DOI
10.1016/0921-5107(95)01460-8
Web of Science ID

WOS:A1996UM73500013

Author(s)
Dwir, B.  
Reinhardt, F.
Biasiol, G.
Kapon, E.  
Date Issued

1996

Published in
Materials Science and Engineering B
Volume

37

Start page

83

End page

88

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPN  
Available on Infoscience
February 29, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/19580
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