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conference paper
The structure of thin mettalic layers for ohmic and Schottky contacts in GaAs and silicon devices
1989
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Type
conference paper
Authors
Publication date
1989
Published in
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Series title/Series vol.
Institute of Physics Conference Series; 100
Start page
677
End page
682
Peer reviewed
REVIEWED
EPFL units
| Event name |
Available on Infoscience
February 15, 2007
Use this identifier to reference this record