Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. High-Precision Aligned Silicon Wafer Bonding for a Micromachined AFM Sensor
 
conference paper

High-Precision Aligned Silicon Wafer Bonding for a Micromachined AFM Sensor

Brugger, J.
•
Jaecklin, V. P.
•
Linder, C.
Show more
1993
2nd Int. Symp. On Semiconductor Wafer Bonding: Science Technology and Applications
  • Details
  • Metrics
Type
conference paper
Author(s)
Brugger, J.
Jaecklin, V. P.
Linder, C.
Blanc, N.
de Rooij, N. F.  
Date Issued

1993

Published in
2nd Int. Symp. On Semiconductor Wafer Bonding: Science Technology and Applications
Volume

93-29

Start page

363

End page

372

Editorial or Peer reviewed

NON-REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39102
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés