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research article
Advanced Scanning Probes for Micro-Nano Science Researches
In this study, we introduce five unique scanning vibes developed in our laboratory for different fields of application These probes are the results of excellent collaborations with many external partners Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system The applications of these probes are very versatile. from atomic force microscope for the exploration of Mars to In vivo measurements of human knee cartilage (C) 2010 Institute of Electrical Engineers of Japan Published by John Wiley & Sons. Inc
Type
research article
Web of Science ID
WOS:000277128900001
Authors
•
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Parrat, Daniel
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Imer, Raphael
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Vettiger, Peter
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Staufer, Urs
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Publication date
2010
Publisher
Volume
5
Start page
259
End page
262
Peer reviewed
NON-REVIEWED
EPFL units
Available on Infoscience
May 19, 2010
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