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  4. Modification of textured silicon wafer surface morphology for fabrication of heterojunction solar cell with open circuit voltage over 700mV
 
conference paper

Modification of textured silicon wafer surface morphology for fabrication of heterojunction solar cell with open circuit voltage over 700mV

Fesquet, L.
•
Olibet, S.
•
Damon-Lacoste, J.
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2010
2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
34th IEEE PVSC

Crystalline silicon wafer (c-Si) can be extremely well passivated by plasma enhanced chemical vapor deposited (PECVD) amorphous silicon (a-Si:H) films. As a result, on flat substrates, solar cells with very high open circuit voltage are readily obtained. On textured substrates however the passivation is more cumbersome, likely due to the presence of localized recombinative paths situated at the pyramid valleys. Here, we show that this issue may be resolved by selecting a silicon substrate morphology featuring large pyramids. Chemical post-texturization treatments can further reduce the surface recombination velocity. This sequence has allowed us to fabricate solar cells with open circuit voltage over 700 mV, demonstrating also on device level the effect of pyramid density and surface micro-roughness on the surface passivation quality.

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Type
conference paper
DOI
10.1109/PVSC.2009.5411173
Web of Science ID

WOS:000280345900127

Author(s)
Fesquet, L.
Olibet, S.
Damon-Lacoste, J.
De-Wolf, S.  
Hessler-Wyser, A.  
Ballif, C.  
Date Issued

2010

Published in
2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Start page

000754

End page

000758

Note

IMT-NE Number: 529

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PV-LAB  
CIME  
Event nameEvent placeEvent date
34th IEEE PVSC

Philadelphia, PA

2009

Available on Infoscience
February 1, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/46342
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