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Push-out tests for grouped arrangement of stud connectors
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report
Push-out tests for grouped arrangement of stud connectors
Okada, J.
•
Lebet, J. P.
2000
Details
Metrics
Type
report
Authors
Okada, J.
•
Lebet, J. P.
Publication date
2000
Subjects
420/ICOM
EPFL units
ICOM
Available on Infoscience
January 24, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/16936