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  4. Study of the epitaxial relationships between III-nitrides and M-plane sapphire
 
research article

Study of the epitaxial relationships between III-nitrides and M-plane sapphire

Vennegues, Philippe
•
Zhu, Tiankai
•
Martin, Denis
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2010
Journal of Applied Physics

GaN films epitaxially-grown on M-sapphire may have different orientations, either nonpolar and semipolar. In this paper, the different epitaxial relationships are investigated in details thanks to transmission electron microscopy. It is shown that these relationships drastically depend on the nitridation conditions. Mechanisms explaining the different epitaxial relationships are proposed. These mechanisms take into account the formation of a nitridation layer, the lattice mismatches between the growing films, and the substrate, and the surface energies. It is, moreover, shown that the difference of symmetries between the M-sapphire surface and the epitaxial films leads to the formation of growth twins for the (10 (1) over bar0) and (10 (1) over bar(3) over bar) orientations. (C) 2010 American Institute of Physics. [doi:10.1063/1.3514095]

  • Details
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Type
research article
DOI
10.1063/1.3514095
Web of Science ID

WOS:000285474100049

Author(s)
Vennegues, Philippe
Zhu, Tiankai
Martin, Denis
Grandjean, Nicolas  
Date Issued

2010

Published in
Journal of Applied Physics
Volume

108

Issue

11

Article Number

113521

Subjects

Light-Emitting-Diodes

•

Transmission Electron-Microscopy

•

Semipolar Gan Templates

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Vapor-Phase Epitaxy

•

Films

•

Nonpolar

•

Growth

•

Nitridation

•

Crystals

•

Surfaces

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LASPE  
Available on Infoscience
December 16, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/74810
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