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Degradation of electron-beam-pumped Zn1-xCdxSe/ZnSe GRINSCH blue-green lasers

Bonard, J. M.
•
Ganiere, J. D.  
•
Herve, D.
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1997
Microscopy of Semiconducting Materials 1997

We explored the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation occurred via the formation of dark spot and dark line defects, and that it involved the formation of a characteristic type of defect, namely dislocation loops within the ZnCdSe quantum well, which grew to form a characteristic network as degradation progressed.

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Type
book part or chapter
Web of Science ID

WOS:000071954600117

Author(s)
Bonard, J. M.
Ganiere, J. D.  
Herve, D.
Vanzetti, L.
Paggel, J. J.
Sorba, L.
Molva, E.
Franciosi, A.
Date Issued

1997

Publisher

Iop Publishing Ltd

Published in
Microscopy of Semiconducting Materials 1997
Start page

565

End page

568

Series title/Series vol.

Institute of Physics Conference Series

Subjects

LIGHT EMITTERS

Note

Ecole Polytech Fed Lausanne, Inst Micro & Optoelect, CH-1015 Lausanne, Switzerland. LETI, Dept Optron, F-38054 Grenoble 9, France. INFM, Lab Natl, Area Ric, I-34012 Trieste, Italy. Bonard, JM, Ecole Polytech Fed Lausanne, Inst Micro & Optoelect, CH-1015 Lausanne, Switzerland.

ISI Document Delivery No.: BK38G

Cited Reference Count: 8

Cited References:

GUHA S, 1993, APPL PHYS LETT, V63, P3107

HERVE D, 1995, APPL PHYS LETT, V67, P2144

HOVINEN M, 1995, APPL PHYS LETT, V66, P2013

HUA GC, 1994, APPL PHYS LETT, V65, P1331

NAKANO K, 1996, J ELECTRON MATER, V25, P213

OHARA S, 1977, APPL PHYS LETT, V30, P368

PETROFF P, 1974, J APPL PHYS, V45, P3899

SALAMANCARIBA L, 1996, J ELECTRON MATER, V25, P239

Article

TECHNO HOUSE, REDCLIFFE WAY, BRISTOL, ENGLAND BS1 6NX

Editorial or Peer reviewed

REVIEWED

Written at

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Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11262
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