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2010
Modeling study of capacitance and gate current in strained HighK-Metal gate technology
conference paper not in proceedings
Type
conference paper not in proceedings
Author(s)
•
Rideau, Denis
•
Dornel, Erwan
•
Clark, William F.
•
Tavernier, Clement
•
•
•
Jaouen, Hervé
Date Issued
2010
Publisher
Written at
EPFL
EPFL units
| Event name | Event date |
2010 | |
Available on Infoscience
October 31, 2011
Use this identifier to reference this record