conference poster not in proceedings
TEM characterization of textured silicon heterojunction solar cells
2008
The usefulness of Transmission Electron Microscopy (TEM) for the fabrication of high-performance textured amorphous/crystalline silicon (a-Si:H/c-Si) heterojunction (HJ) solar cells is demonstrated. The classical characterization techniques used to monitor the a-Si:H layers properties incorporated into flat HJ solar cells with high open-circuit voltages up to VOC=710 mV and electrical conversion efficiencies up to
Type
conference poster not in proceedings
Author(s)
Date Issued
2008
Subjects
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Aachen | September 1-5, 2008 | |
Available on Infoscience
February 15, 2010
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