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research article

Surface morphology of AlN and size dispersion of GaN quantum dots

Matsuse, A.
•
Grandjean, N.  
•
Damilano, B.
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2005
Journal of Crystal Growth

The influence of the basic growth parameters (growth temperature, V/III ratio and growth rate) on the surface morphology of AIN grown by molecular beam epitaxy on sapphire (0 0 0 1) substrate is reported. Optimized-growth conditions lead to a significant decrease of the surface roughness. The use of such surfaces as template to grow GaN quantum dots is shown to improve their size dispersion. (C) 2004 Elsevier B.V. All rights reserved.

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Type
research article
DOI
10.1016/j.jcrysgro.2004.10.147
Author(s)
Matsuse, A.
Grandjean, N.  
Damilano, B.
Massies, J.
Date Issued

2005

Published in
Journal of Crystal Growth
Volume

274

Issue

3-4

Start page

387

End page

393

Subjects

crystal morphology

•

molecular beam epitaxy

•

quantum dots

•

nitrides

•

semiconducting III-V materials

•

MOLECULAR-BEAM EPITAXY

•

OPTICAL-PROPERTIES

•

SAPPHIRE

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LASPE  
Available on Infoscience
October 5, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/55018
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