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  4. Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology
 
conference paper

Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology

Coustans, Mathieu  
•
Jazaeri, Farzan  
•
Enz, Christian  
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2017
2017 International Conference on Noise and Fluctuations (ICNF)
2017 International Conference on Noise and Fluctuations (ICNF)
  • Details
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Type
conference paper
DOI
10.1109/ICNF.2017.7985953
Author(s)
Coustans, Mathieu  
•
Jazaeri, Farzan  
•
Enz, Christian  
•
Krummenacher, Francois  
•
Kayal, Maher  
•
Meyer, Rene
•
Acovic, Alexandre
•
Habas, Predrag
•
Lolivier, Jerome
•
Bucher, Matthias  
Date Issued

2017

Publisher

IEEE

Published in
2017 International Conference on Noise and Fluctuations (ICNF)
Start page

1

End page

4

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
GR-KA  
ICLAB  
Event nameEvent placeEvent date
2017 International Conference on Noise and Fluctuations (ICNF)

Vilnius, Lithuania

20-23 June 2017

Available on Infoscience
August 2, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/139510
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