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research article

Laterally Resolved Measurements of Cesium Iodide Quantum Yield

Dellorto, T.
•
Almeida, J.
•
Coluzza, C.
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1995
Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films

Spatially resolved x-ray secondary electron photoemission spectra revealed lateral changes in quantum efficiency and chemical composition of polycrystalline cesium iodide photodetectors. Such changes depend on the substrate (stainless steel or aluminum). These results emphasize the limitations of conventional, spatially integrated quantum efficiency measurements, and shed new light on the chemical properties of inhomogeneous polycrystalline cesium iodide. (C) 1995 American Vacuum Society.

  • Details
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Type
research article
DOI
10.1116/1.579705
Web of Science ID

WOS:A1995TF11100022

Author(s)
Dellorto, T.
Almeida, J.
Coluzza, C.
Conforto, E.
Destasio, G.
Margaritondo, G.  
Paic, G.
Braem, A.
Piuz, F.
Tonner, B. P.
Date Issued

1995

Published in
Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films
Volume

13

Issue

6

Start page

2787

End page

2790

Subjects

SECONDARY-ELECTRON EMISSION

•

RAY PHOTO-CATHODES

•

WAVELENGTH BAND 1-300

•

X-RAYS

•

CSI

•

PHOTOCATHODES

•

INSULATORS

•

RESOLUTION

•

MODELS

•

FILMS

Note

Rudjer boskovic inst,zagreb,croatia. cern,div ppe,ch-1211 geneva 23,switzerland. univ wisconsin,ctr synchrotron radiat,stoughton,wi 53589. Dellorto, t, ecole polytech fed lausanne,inst phys appl,ch-1015 lausanne,switzerland.

ISI Document Delivery No.: TF111

Editorial or Peer reviewed

REVIEWED

Written at

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Available on Infoscience
October 3, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/234662
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