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  4. Ratio of mirror zone depth to flaw depth after failure of glass beams
 
conference paper

Ratio of mirror zone depth to flaw depth after failure of glass beams

Vandebroek, Marc
•
Belis, Jan
•
Louter, Christian  
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Belis, Jan  
•
Louter, Christian  
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2013
COST Action TU0905, Mid-term Conference on Structural Glass
COST Action TU0905, Mid-term Conference on Structural Glass

A precise estimation of the edge strength becomes an important issue when designing structural glass beams or façade mullions. However, in literature, the glass edge strength is poorly documented compared to the surface strength. In particular, the experimental validation of an edge strength model is lacking. Therefore, in this project, a ratio is assessed between the flaw depth and the mirror zone depth to determine more easily the geometry factor used in the edge strength model. Glass specimens with arrised and ground edges were tested at a high stress rate (50 MPa/s) with an in-plane four-point bending test setup. After failure, the critical flaw and the corresponding mirror zone was examined by means of an optical microscope. As the ratio of these values could be determined rather accurately, in future the geometry factor can be determined only by measuring the mirror zone depth instead of the flaw depth.

  • Details
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Type
conference paper
Author(s)
Vandebroek, Marc
Belis, Jan
Louter, Christian  
Molnar, Gergely
Editors
Belis, Jan  
•
Louter, Christian  
•
Mocibob, Danijel  
Date Issued

2013

Publisher

Taylor & Francis Group

Publisher place

London

Published in
COST Action TU0905, Mid-term Conference on Structural Glass
ISBN of the book

978-1-138-00044-5

Start page

235

End page

241

URL

URL

http://www.glassnetwork.org/conference
Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
RESSLAB  
Event nameEvent placeEvent date
COST Action TU0905, Mid-term Conference on Structural Glass

Porec, Croatia

April 18-19, 2013

Available on Infoscience
March 3, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/90042
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