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  4. Analysis of the Heterogate Electron-Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities
 
research article

Analysis of the Heterogate Electron-Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities

Padilla, JL
•
Medina-Bailon, C
•
Navarro, C
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2018
IEEE Transactions on Electron Devices
  • Details
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Type
research article
DOI
10.1109/TED.2017.2777666
Author(s)
Padilla, JL
Medina-Bailon, C
Navarro, C
Alper, C
Gamiz, F
Ionescu, AM
Date Issued

2018

Published in
IEEE Transactions on Electron Devices
Volume

65

Issue

1

Start page

339

End page

346

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
Available on Infoscience
November 8, 2018
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/149861
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