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  4. STATISTICAL PROPERTIES OF SCHOTTKY SPECTRA
 
conference paper

STATISTICAL PROPERTIES OF SCHOTTKY SPECTRA

Lannoy, C.
•
Alves, D.
•
Lasocha, K.
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2023
Proceedings of the International Beam Instrumentation Conference, IBIC
12 International Beam Instrumentation Conference

Schottky signals are used for non-invasive beam diagnostics as they contain information on various beam and machine parameters. The instantaneous Schottky signal is, however, only a single realisation of a random process, implicitly depending on the discrete distribution of synchrotron and betatron amplitudes and phases among the particles. To estimate the expected value of the Schottky power spectrum, and reveal the inner structure of the Bessel satellites described by the theory, the averaging of instantaneous Schottky spectra is required. This study describes this procedure quantitatively by analysing the statistical properties of the Schottky signals, including the expected value and variance of Schottky power spectra. Furthermore, we investigate how these quantities evolve with the number of particles in the bunch, the observed harmonic of the revolution frequency, the distribution of synchrotron oscillation amplitudes, and the bunch profile. The theoretical findings are compared against macro-particle simulations as well as Monte Carlo computations.

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Type
conference paper
DOI
10.18429/JACoW-IBIC2023-WEP035
Scopus ID

2-s2.0-85185843092

Author(s)
Lannoy, C.

Organisation Européenne pour la Recherche Nucléaire

Alves, D.

Organisation Européenne pour la Recherche Nucléaire

Lasocha, K.

Organisation Européenne pour la Recherche Nucléaire

Mounet, N.

Organisation Européenne pour la Recherche Nucléaire

Pieloni, T.  

École Polytechnique Fédérale de Lausanne

Date Issued

2023

Publisher

JACoW Publishing

Published in
Proceedings of the International Beam Instrumentation Conference, IBIC
ISBN of the book

9783954502363

Start page

433

End page

437

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPAP  
Event nameEvent acronymEvent placeEvent date
12 International Beam Instrumentation Conference

Saskatoon, Canada

2023-09-10 - 2023-09-14

Available on Infoscience
January 26, 2025
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/245207
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