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  4. Design of Compact Imperfection-Immune CNFET Layouts for Standard-Cell-Based Logic Synthesis
 
conference paper

Design of Compact Imperfection-Immune CNFET Layouts for Standard-Cell-Based Logic Synthesis

Bobba, Shashikanth
•
Zhang, Jie
•
Pullini, Antonio  
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2009
Proceedings of the Design, Automation and Test in Europe Conference (DATE)
Design, Automation & Test in Europe Conference, (DATE)

The quest for technologies with superior device characteristics has showcased Carbon Nanotube Field Effect Transistors (CNFETs) into limelight. Among the several design aspects necessary for today’s grail in CNFET technology, achieving functional immunity to Carbon Nanotube (CNT)manufacturing issues (such as mispositioned CNTs and metallic CNTs) is of paramount importance. In this work we present a new design technique to build compact layouts while ensuring 100% functional immunity to mispositioned CNTs. Then, as second contribution of this work, we have developed a CNFET Design Kit (DK) to realize a complete design flow from logictoGDSII traversing the conventional CMOS design flow; thereby staging an accurate comparison between CMOS and CNFETbased circuits. Our experimental results show that for an optimal choice, with respect to EnergyDelay Product (EDP), CNFET based inverter can achieve 4.2x gain in delay, 2x gain in energy/cycle and 1.4x gain in area when compared to corresponding CMOS inverter benchmarked with an industrial 65nm technology.

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Type
conference paper
DOI
10.1109/DATE.2009.5090741
Web of Science ID

WOS:000273246700112

Author(s)
Bobba, Shashikanth
Zhang, Jie
Pullini, Antonio  
Atienza, David  
Wong, H.-S. Philip
De Micheli, Giovanni  
Date Issued

2009

Published in
Proceedings of the Design, Automation and Test in Europe Conference (DATE)
Start page

616

End page

621

Subjects

Carbon Nanotube Transistors

•

Logic Synthesis

•

CNT

•

Imperfection Immune

•

Misaligned Immune

•

CNFET

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSI1  
ESL  
Event nameEvent placeEvent date
Design, Automation & Test in Europe Conference, (DATE)

Nice, France

April 20-24, 2009

Available on Infoscience
December 24, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/33020
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