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  4. Scanning near-field optical microscopy with aperture probes: Fundamentals and applications
 
review article

Scanning near-field optical microscopy with aperture probes: Fundamentals and applications

Sick, B.
•
Wild, U. P.
•
Deckert, V.
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2000
Journal Of Chemical Physics

In this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and field distributions in the vicinity of subwavelength apertures. Furthermore, the near-field optical image formation mechanism is analyzed with special emphasis on potential sources of artifacts. To underline the prospects of the technique, selected applications including amplitude and phase contrast imaging, fluorescence imaging, and Raman spectroscopy, as well as near-field optical desorption, are presented. These examples demonstrate that scanning near-field optical microscopy is no longer an exotic method but has matured into a valuable tool. (C) 2000 American Institute of Physics. [S0021-9606(00)70316-3].

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Type
review article
DOI
10.1063/1.481382
Web of Science ID

WOS:000086617600004

Author(s)
Sick, B.
Wild, U. P.
Deckert, V.
Zenobi, R.
Martin, O. J. F.  
Pohl, D. W.
Hecht, B.
Date Issued

2000

Publisher

American Institute of Physics

Published in
Journal Of Chemical Physics
Volume

112

Start page

7761

End page

7774

Subjects

Enhanced Raman-Scattering

•

Etched Fiber Tips

•

Shear-Force

•

Nanometer-Scale

•

Tunneling-Microscopy

•

Individual Molecules

•

Light-Propagation

•

Laser-Desorption

•

Single Molecules

•

Wave-Guides

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NAM  
Available on Infoscience
April 11, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/66205
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