Loading...
research article
Scanning Tunneling Microscopy and Potentiometry on a Semiconductor Heterojunction
Type
research article
Authors
Publication date
1987
Published in
Volume
50
Issue
19
Start page
1352
End page
1354
Note
Ibm Corp,Div Res,Zurich Res Lab,Ch-8803 Ruschlikon,Switzerland
H1808
Cited References Count:5
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
August 21, 2006
Use this identifier to reference this record