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research article

Ultrathin organic transistors on oxide surfaces

Daraktchiev, M.
•
von Mühlenen, A.
•
Nüesch, F.  
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2005
New Journal of Physics

We have built a model organic field-effect transistor that is basically composed of a single layer of pentacene crystal in interaction with an oxide surface. Drain and source contacts are ohmic so that the pentacene layer can carry a current density as high as 3000 A cm-2 at a gate voltage of -60 V. Four-probe and two-probe transport measurements as a function of temperature and fields are presented in relation with structural near-field observations. The experimental results suggest a simple two-dimensional model where the equilibrium between free and trapped carriers at the oxide interface determines the OFET characteristics and performance

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Type
research article
DOI
10.1088/1367-2630/7/1/133
Web of Science ID

WOS:000229326900003

Author(s)
Daraktchiev, M.
von Mühlenen, A.
Nüesch, F.  
Schaer, M.  
Brinkmann, M.
Bussac, M. N.  
Zuppiroli, L.  
Date Issued

2005

Publisher

Deutsche Physikalische Gesellschaft & IOP Publishing Ltd

Published in
New Journal of Physics
Volume

7

Issue

1

Start page

133

Subjects

current density

•

field effect transistors

•

organic compounds

•

thin film transistors

•

ultrathin organic transistors

•

ohmic contacts

•

organic field-effect transistor

•

pentacene crystal

•

oxide surfaces

•

source contacts

•

drain contacts

•

pentacene layer

•

current density

•

gate voltage

•

two-probe transport measurements

•

four-probe transport measurements

•

structural near-field observations

•

two-dimensional model

•

trapped carriers

•

free carriers

•

oxide interface

•

-60 V

Note

8609240

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOMM  
Available on Infoscience
April 3, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/4253
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