Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Shot noise and squeezing in the conduction channel of a Field Effect Transistor at ultra-low temperature
 
conference paper not in proceedings

Shot noise and squeezing in the conduction channel of a Field Effect Transistor at ultra-low temperature

Manseau, Anthoni
•
Pinsolle, Edouard
•
Lupien, Christian
Show more
Enz, Christian  
2019
25th International Conference on Noise and Fluctuations (ICNF 2019)
  • Files
  • Details
  • Metrics
Type
conference paper not in proceedings
DOI
10.5075/epfl-ICLAB-ICNF-269301
Author(s)
Manseau, Anthoni
Pinsolle, Edouard
Lupien, Christian
Reulet, Bertrand
Editors
Enz, Christian  
Date Issued

2019

Publisher

ICLAB

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
ICLAB  
Event nameEvent placeEvent date
25th International Conference on Noise and Fluctuations (ICNF 2019)

EPFL Neuchâtel campus - Neuchâtel, Switzerland

18 - 21 June 2019

Available on Infoscience
August 23, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/160160
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés