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  4. An analog high-speed single-cycle lock-in amplifier for next generation AFM experiments
 
conference paper

An analog high-speed single-cycle lock-in amplifier for next generation AFM experiments

Schlecker, B.
•
Nievergelt, A.  
•
Ortmanns, M.
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January 1, 2018
2018 Ieee Sensors
17th IEEE SENSORS Conference

In this paper, we present a new architecture for analog amplitude demodulation in high-speed atomic force microscopy (AFM) applications. It features single-cycle capabilities and the possibility to work with elevated cantilever resonance frequencies up to 9MHz. This latter feature is particularly important in view of the upcoming next generation of high resonance frequency cantilevers. As a proof-of-principle, we show a prototype of the proposed single-sideband upconversion architecture to be able to work with a conventional MultiMode 8 AFM system (Bruker) and a FastScan-A cantilever in air with f(res) approximate to 1.6 MHz. Overall, the presented lock-in amplifier with its improved demodulation speed will foster the research activities towards faster imaging speeds in AFM applications and thereby allow to further establish it as a tool for real-time studies of the dynamics of molecular and even atomic processes.

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Type
conference paper
DOI
10.1109/ICSENS.2018.8589857
Web of Science ID

WOS:000468199300044

Author(s)
Schlecker, B.
Nievergelt, A.  
Ortmanns, M.
Fantner, G.  
Anders, J.
Date Issued

2018-01-01

Publisher

IEEE

Publisher place

New York

Published in
2018 Ieee Sensors
ISBN of the book

978-1-5386-4707-3

Series title/Series vol.

IEEE Sensors

Start page

168

End page

171

Subjects

Engineering, Electrical & Electronic

•

Remote Sensing

•

Engineering

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LBNI  
Event nameEvent placeEvent date
17th IEEE SENSORS Conference

New Delhi, INDIA

Oct 28-31, 2018

Available on Infoscience
June 18, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/157444
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