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conference paper

Semantic Attribute Matching Networks

Kim, Seungryong  
•
Min, Dongbo
•
Jeong, Somi
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January 1, 2019
2019 Ieee/Cvf Conference On Computer Vision And Pattern Recognition (Cvpr 2019)
IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

We present semantic attribute matching networks (SAM-Net) for jointly establishing correspondences and transferring attributes across semantically similar images, which intelligently weaves the advantages of the two tasks while overcoming their limitations. SAM-Net accomplishes this through an iterative process of establishing reliable correspondences by reducing the attribute discrepancy between the images and synthesizing attribute transferred images using the learned correspondences. To learn the networks using weak supervisions in the form of image pairs, we present a semantic attribute matching loss based on the matching similarity between an attribute transferred source feature and a warped target feature. With SAM-Net, the state-of-the-art performance is attained on several benchmarks for semantic matching and attribute transfer.

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Type
conference paper
DOI
10.1109/CVPR.2019.01262
Web of Science ID

WOS:000542649305097

Author(s)
Kim, Seungryong  
Min, Dongbo
Jeong, Somi
Kim, Sunok
Jeon, Sangryul
Sohn, Kwanghoon
Date Issued

2019-01-01

Publisher

IEEE

Publisher place

New York

Published in
2019 Ieee/Cvf Conference On Computer Vision And Pattern Recognition (Cvpr 2019)
ISBN of the book

978-1-7281-3293-8

Series title/Series vol.

IEEE Conference on Computer Vision and Pattern Recognition

Start page

12331

End page

12340

Subjects

Computer Science, Artificial Intelligence

•

Computer Science, Theory & Methods

•

Computer Science

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CVLAB  
Event nameEvent placeEvent date
IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Long Beach, CA

Jun 16-20, 2019

Available on Infoscience
July 18, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/170226
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