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research article

Stress Engineering for Mitigating Thermal Cycling Fatigue in Perovskite Photovoltaics

Chen, Min
•
Dong, Yifan
•
Zhang, Yi  
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May 8, 2024
Acs Energy Letters

Mechanical residual stresses within multilayer thin-film device stacks become problematic during thermal changes because of differing thermal expansion and contraction of the various layers. Thin-film photovoltaic (PV) devices are a prime example where this is a concern during temperature fluctuations that occur over long deployment lifetimes. Here, we show control of the residual stress within halide perovskite thin-film device stacks by the use of an alkyl-ammonium additive. This additive approach reduces the residual stress and strain to near-zero at room temperature and prevents cracking and delamination during intense and rapid thermal cycling. We demonstrate this concept in both n-i-p (regular) and p-i-n (inverted) unencapsulated perovskite solar cells and minimodules with both types of solar cells retaining over 80% of their initial power conversion efficiency (PCE) after 2500 thermal cycles in the temperature range of -40 to 85°C. The mechanism by which stress engineering mitigates thermal cycling fatigue in these perovskite PVs is discussed.

  • Details
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Type
research article
DOI
10.1021/acsenergylett.4c00988
Web of Science ID

WOS:001225132100001

Author(s)
Chen, Min
Dong, Yifan
Zhang, Yi  
Zheng, Xiaopeng
McAndrews, Gabriel R.
Dai, Zhenghong
Jiang, Qi
You, Shuai
Liu, Tuo
Harvey, Steven P.
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Date Issued

2024-05-08

Publisher

Amer Chemical Soc

Published in
Acs Energy Letters
Subjects

Physical Sciences

•

Technology

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LCOM  
FunderGrant Number

Office of Naval Research

National Renewable Energy Laboratory

DE-AC36-08GO28308

U.S. Department of Energy (DOE)

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Available on Infoscience
June 5, 2024
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/208391
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